Kızılötesi Yayılma Test Cihazı - Kızılötesi Yayılma Testerimalzeme ve Kaplama yüzeyi Emisivite Ölçümü Cihaz

Infrared emissivity tester-Infrared emissivity testerMaterial and coating surface emissivity measuring device

The IR-2 dual-band emissivity measuring instrument was researched by the Chinese Academy of Sciences researchers in the national invention patent ZL 91107415 "A method for measuring emissivity on the spot" and the "Second Prize of Shanghai Scientific and Technological Progress" in 1997 "Object Emissivity Method and Apparatus" and the first generation "IR-1 Emissivity Measuring Instrument". Continuously improved and successfully developed special instrument for measuring the emissivity of infrared materials

I,the main purpose
1. Research and testing of infrared stealth materials for weapons and equipment.
2. Research and test of infrared baking high-emission coating materials.
3. Research and test of infrared emissivity of building materials, insulation materials, coating materials and paper.
4. Research and test of emissivity of thermal insulation textiles doped with infrared material in textile industry.
5. Relevant research departments measure and study the characteristics of infrared radiation.

II,Main Specifications 
1. Measurement band: 1 ~ 22μm 3 ~ 5μm 8 ~ 14μm
(If the user has special requirements, different wavelength filters can be customized)
2. Emissivity measurement range: 0.1 ~ 0.99
3. Sensitivity: 0.001
4. Indication error: ± 0.02 (> 0.50)
5. Repeatability: ± 0.01
6. Sample temperature: normal temperature (for special users, normal temperature to 300 ºC or to 600ºC)
7. Sample size: ≤ 40 mm
8. Measurement time: After 3 seconds, press switch E to display the measurement value.
9. Display method: LED digital display, last 0.001
10. Power supply: AC 220V 50Hz